各种SRAM电池结构降低泄漏能量的研究

Ashish Sachdeva, V. Tomar
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引用次数: 6

摘要

本文研究了不同的SRAM(静态随机存取存储器)单元,并比较了它们的功耗和漏电流。这些不同的研究结构还与正常的6-T SRAM电池进行了比较,并在180nm下进行了模拟。根据展望,一些研究改进的结构比常规的6-T SRAM电池功耗更低。静态能量下降很明显,但这也表明它没有按照预期水平下降。可能的原因多种多样,但一致认为是其他因素导致了动态泄漏能的增加,这可能是造成这种结果的原因之一。然而,在这种情况下也做了一些工作,这在论文的后半部分进行了讨论。研究发现,所研究的技术的总耗散减少在35%-66%的范围内。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigations of various SRAM cell structures for leakage energy reduction
In this Paper different SRAM (Static Random Access Memories) cells are studied and compared w.r.t. their power dissipations and current leakage. These different studied structures are also compared with a normal 6-T SRAM cell, which is simulated under 180nm technology. As per outlooks some of the studied improved structures have less power consumptions then the regular 6-T SRAM cell. The static energy drop is clear but this also displays that it didn't came down as per expectation level. The possible causes are diverse, nevertheless, it is agreed that the other factors cause increment in dynamic leakage energy, which possibly is a reason for such results. However there is some work done in such case also, that has been discussed in later half of the paper. The total reduction in dissipation for the studied techniques was found to be in the range of 35%–66% approximately.
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