{"title":"嵌入式存储器阵列内建自修复的神经计算","authors":"P. Mazumder, Jih-Shyr Yih","doi":"10.1109/FTCS.1989.105623","DOIUrl":null,"url":null,"abstract":"A demonstration is presented of how to represent the objective function of the memory repair problem as a neural network energy function, and how to utilize the neural net's convergence property to find near-optimal solutions. Two algorithms have been developed using a neural network, and their performance is compared with the 'repair most' algorithm that is used commercially. For randomly generated defect patterns, the proposed algorithm with a hill-climbing capability has been found to be successful in repairing memory arrays in 98% of the cases, as opposed to the repair most algorithm's 20% of cases.<<ETX>>","PeriodicalId":230363,"journal":{"name":"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Neural computing for built-in self-repair of embedded memory arrays\",\"authors\":\"P. Mazumder, Jih-Shyr Yih\",\"doi\":\"10.1109/FTCS.1989.105623\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A demonstration is presented of how to represent the objective function of the memory repair problem as a neural network energy function, and how to utilize the neural net's convergence property to find near-optimal solutions. Two algorithms have been developed using a neural network, and their performance is compared with the 'repair most' algorithm that is used commercially. For randomly generated defect patterns, the proposed algorithm with a hill-climbing capability has been found to be successful in repairing memory arrays in 98% of the cases, as opposed to the repair most algorithm's 20% of cases.<<ETX>>\",\"PeriodicalId\":230363,\"journal\":{\"name\":\"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FTCS.1989.105623\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1989] The Nineteenth International Symposium on Fault-Tolerant Computing. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1989.105623","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Neural computing for built-in self-repair of embedded memory arrays
A demonstration is presented of how to represent the objective function of the memory repair problem as a neural network energy function, and how to utilize the neural net's convergence property to find near-optimal solutions. Two algorithms have been developed using a neural network, and their performance is compared with the 'repair most' algorithm that is used commercially. For randomly generated defect patterns, the proposed algorithm with a hill-climbing capability has been found to be successful in repairing memory arrays in 98% of the cases, as opposed to the repair most algorithm's 20% of cases.<>