{"title":"无孔径近场光学显微镜中尖端到样品的距离控制","authors":"A. Milner, Kaiyin Zhang, Yehiam Prior","doi":"10.1109/CLEO.2007.4453273","DOIUrl":null,"url":null,"abstract":"Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.","PeriodicalId":152616,"journal":{"name":"2007 Quantum Electronics and Laser Science Conference","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Tip-to-sample distance control in apertureless near-field optical microscopy\",\"authors\":\"A. Milner, Kaiyin Zhang, Yehiam Prior\",\"doi\":\"10.1109/CLEO.2007.4453273\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.\",\"PeriodicalId\":152616,\"journal\":{\"name\":\"2007 Quantum Electronics and Laser Science Conference\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 Quantum Electronics and Laser Science Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CLEO.2007.4453273\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Quantum Electronics and Laser Science Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CLEO.2007.4453273","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Tip-to-sample distance control in apertureless near-field optical microscopy
Novel mode of AFM operation is proposed providing the small, few nanometers tip to sample gap, appropriate for the ANSOM experiments. A set-up open for the run-time adjustments, working at ambient conditions is considered.
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