基于直列硅光电探测器的波导损耗原位精确测量技术

2021 IEEE 17th International Conference on Group IV Photonics (GFP) Pub Date : 2021-12-01 DOI:10.1109/GFP51802.2021.9673830

Chaoxuan Ma, Ranjeet Kumar, M. Sakib, Duanni Huang, H. Rong

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引用次数: 0

摘要

我们演示了一种精确的原位损耗测量技术，使用在线硅光电探测器。通过测量嵌入在硅波导中的硅光电探测器的光电流，我们在100次重复测量的基础上提取了标准偏差为0.03 dB/cm的波导损耗。

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A Precision in-situ Waveguide Loss Measurement Technique Using In-line Silicon Photodetectors

We demonstrate a precise in-situ loss measurement technique using in-line silicon photodetectors. By measuring the photocurrents from silicon photodetectors embedded in a silicon waveguide, we extracted the waveguide loss with a standard deviation of 0.03 dB/cm based on 100 repeated measurements.

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2021 IEEE 17th International Conference on Group IV Photonics (GFP)

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