{"title":"利用悬浮金属环降低辐射远场发射和磁化率","authors":"M. Koohestani, M. Ramdani, R. Perdriau","doi":"10.1109/EMCEUROPE48519.2020.9245726","DOIUrl":null,"url":null,"abstract":"This paper presents the use of a small simple loop above a printed circuit board (PCB) to mitigate both the emission at 1 m (suggested by CISPR-25) and far-field susceptibility of a patch located on the PCB (used as an approximation for an integrated circuit). Loop parameters were optimized through full-wave simulations with respect to patch size, loop-to-PCB distance and operating frequency. This technique makes it possible, at the same time, to reduce emission by an average of 83%, and to decrease H-field coupling to the integrated circuit pins along with E-field amplitude, thus reducing susceptibility. This study clearly demonstrates the relevance of that simple and inexpensive approach for practical use in applications such as complex high-speed electronics including Systems-in-Package (SiP).","PeriodicalId":332251,"journal":{"name":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Reduction of Radiated Far-Field Emission and Susceptibility Using a Suspended Metal Loop\",\"authors\":\"M. Koohestani, M. Ramdani, R. Perdriau\",\"doi\":\"10.1109/EMCEUROPE48519.2020.9245726\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the use of a small simple loop above a printed circuit board (PCB) to mitigate both the emission at 1 m (suggested by CISPR-25) and far-field susceptibility of a patch located on the PCB (used as an approximation for an integrated circuit). Loop parameters were optimized through full-wave simulations with respect to patch size, loop-to-PCB distance and operating frequency. This technique makes it possible, at the same time, to reduce emission by an average of 83%, and to decrease H-field coupling to the integrated circuit pins along with E-field amplitude, thus reducing susceptibility. This study clearly demonstrates the relevance of that simple and inexpensive approach for practical use in applications such as complex high-speed electronics including Systems-in-Package (SiP).\",\"PeriodicalId\":332251,\"journal\":{\"name\":\"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE48519.2020.9245726\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE48519.2020.9245726","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reduction of Radiated Far-Field Emission and Susceptibility Using a Suspended Metal Loop
This paper presents the use of a small simple loop above a printed circuit board (PCB) to mitigate both the emission at 1 m (suggested by CISPR-25) and far-field susceptibility of a patch located on the PCB (used as an approximation for an integrated circuit). Loop parameters were optimized through full-wave simulations with respect to patch size, loop-to-PCB distance and operating frequency. This technique makes it possible, at the same time, to reduce emission by an average of 83%, and to decrease H-field coupling to the integrated circuit pins along with E-field amplitude, thus reducing susceptibility. This study clearly demonstrates the relevance of that simple and inexpensive approach for practical use in applications such as complex high-speed electronics including Systems-in-Package (SiP).