Non-Contact Antenna Characterization via One-Port Network Calibration

The millimeter wave (mmW) and terahertz (THz) transceiver-integrated antennas continue to find novel applications in many imaging and wireless communication scenarios. Along with the current advancements in electronic transceiver technologies, integrated antenna designs facilitate the implementation of low-profile, high-performance sensors and network nodes and enable unprecedented system-level functionality. Nevertheless, a key challenge in development of such systems is the complexity associated with the characterization of the chip-integrated antennas in mmW and THz bands. In a conventional setting, the antenna performance is highly influenced by test cables and connectors as well as the environment in the antenna's vicinity. High losses associated with the cables, connectors and probes further degrade measurement quality and repeatability at mmW and THz frequencies.