Hg1-xCdxTe亚毫米探测

J. Giles, M. Kimmitt, G. C. Lopez, H. Röser
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引用次数: 0

摘要

在最近的论文[1]和[2]中,Weber和Kulpa报道了合金半导体Hg1-xCdxTe作为长波电子测热计探测器的有用性。虽然我们的主要兴趣是将这种半导体用作远红外外差实验的混频器[3],但我们也不可避免地研究了其更广泛的响应。虽然这项研究还处于相当早期的阶段,并且一些结果不容易解释,但我们的最佳探测器具有良好的探测率(500 μm的NEP < 1 × 10−11 WHz−1 / 2,900 μm的NEP < 5 × 10−12 WHz−1 / 2),并且响应速度明显快于n-InSb。此外,与n-InSb相比,探测器的构造非常简单,在不使用磁场的情况下,需要相当大的独创性来制造高阻抗,高电压响应性探测器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Submillimeter detection with Hg1-xCdxTe
In recent papers [1] and [2] Weber and Kulpa have reported on the usefulness of the alloy semiconductor Hg1-xCdxTe as a long wavelength electron bolometer detector. Although our main interest is in the use of this semiconductor as a mixer for far infrared heterodyne experiments [3], we have inevitably also studied its wider response. Although this research is at a fairly early stage, and some of the results are not easy to interpret, our best detector has a good detectivity (NEP < 1 × 10−11 WHz−½ at 500 μm and < 5 × 10−12 WHz−½ at 900 μm), with a significantly faster response than n-InSb. Moreover, construction of the detector is very simple compared with n-InSb where considerable ingenuity is required to make high impedance, high voltage responsivity detectors without employing magnetic fields.
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