生长和电子辐照ZnO的电学和光学性质

D. Look, D. C. Reynolds, J. Hemsky, J. Sizelove, R.L. Jones, C. Litton, T. Wille, G. Cantwell, W. Harsch
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引用次数: 0

摘要

通过温度相关霍尔效应(TDH)和光致发光(PL)测量,研究了新型气相输运法生长的大直径(3英寸)n型ZnO微球。从对TDH数据的拟合来看,优势供体的浓度N/sub D/约为1/spl乘以/10/sup 17/ cm/sup -3/,能量约为60 meV,接近预期的氢值,而受体的总浓度N/sub a /要低得多,约为2/spl乘以/10/sup 15/ cm/sup -3/。2-K PL数据包括一系列在3.356-3.366 eV能量范围内的至少7条尖锐线,并且从极化,磁场和退火(高达1000/spl度/C)实验中,这些线被解释为与原子种之间具有不同间距的供体配合物相关的供体束缚激子。电子辐照实验表明,当电子轰击能量约为1.3 MeV时,由于锌的位移,存在电学和光阈值。辐照产生受体并破坏浅层供体,但这些效应的产生率远低于大多数其他常见半导体材料,如Si, GaAs和GaN。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electrical and optical properties of as-grown and electron-irradiated ZnO
Large-diameter (up to 3-inch), n-type ZnO boules grown by a new vapor-phase transport method were studied by temperature-dependent Hall-effect (TDH) and photoluminescence (PL) measurements. From fits to the TDH data, the dominant donor has a concentration N/sub D/ of about 1/spl times/10/sup 17/ cm/sup -3/ and an energy of about 60 meV, close to the expected hydrogenic value, whereas the total acceptor concentration N/sub A/ is much lower, about 2/spl times/10/sup 15/ cm/sup -3/. The 2-K PL data include a series of at least seven sharp lines over the energy range 3.356-3.366 eV, and from polarization, magnetic-field, and annealing (up to 1000/spl deg/C) experiments, these lines are interpreted as donor-bound excitons associated with donor complexes having different spacings between the atomic species. Electron-irradiation experiments show an electrical and optical threshold, attributed to Zn displacements, at an electron bombardment energy of about 1.3 MeV. The irradiation creates acceptors and destroys shallow donors, but these effects are produced at much lower rates than those found in most other common semiconductor materials, such as Si, GaAs, and GaN.
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