基于紧密结合方法的硅纳米线方向相关能带结构计算

X. Guan, Zhiping Yu
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引用次数: 4

摘要

采用紧密结合(TB)模型研究了半导体纳米线的能带结构。通过SP3d5s*在TB方法中的具体实现,可以快速准确地评估纳米线带结构的方向依赖性。研究发现,虽然纳米线的大部分轴向都保留了体硅的间接带隙,但特定的轴向可以呈现直接带隙特征。在本文中,[112]定向硅纳米线已经使用超级单体方法进行了模拟,并与现有的测量数据进行了比较。结果表明,该方法具有较高的可靠性和有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Orientation-Dependent Energy Bandstructure Calculation for Silicon Nanowires Using Supercell Approach with the Tight-Binding Method
The Tight-Binding (TB) model has been applied to investigate the bandstructures for semiconductor nanowires. With a specific implementation of SP3d5s* in the TB method, the orientation dependence of nanowire bandstructures can be quickly and accurately evaluated. It is found that while most axial directions of nanowires preserve the indirect band gap of bulk silicon, particular orientation can render direct band gap feature. In this paper, a [112] oriented silicon nanowire has been simulated using supercell approach and compared to the available measured data. The good agreement shows the proposed method is highy reliable and efficient.
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