电场强度对豆芽生长影响的比较

Asia-Pacific Conference on Environmental Electromagnetics, 2003. CEEM 2003. Proceedings. Pub Date : 1900-01-01 DOI:10.1109/CEEM.2003.238651

P. Kiatgamjorn, W. Khan-ngern, S. Nitta

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引用次数: 5

摘要

电场强度在10、20、25 kV/m时变化。本文的重点是茎的高度和根的长度。评价了电场强度对豆芽生长的影响。采用有限元法对电场强度进行了分析。实验结果表明，根据统计分析，高电场条件下豆芽的生长优于低电场条件下豆芽的生长。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The comparison of electric field intensity effects to the bean sprouts growing

The electric field intensity is varied at 10, 20, 25 kV/m. This paper is focused on the height of stems and the length of roots. The effect of electric field intensity is evaluated on bean sprout growing. The electric field intensity is analyzed by the finite element method. Experimental results indicate that the bean sprout in high electric field intensity has a better growth in comparison with that of low electric field based on statistical analysis.

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Asia-Pacific Conference on Environmental Electromagnetics, 2003. CEEM 2003. Proceedings.

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