利用等离子体纳米粒子测量成像系统中的色差

2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS) Pub Date : 2015-12-03 DOI:10.1109/METAMATERIALS.2015.7342467

Sylvain D. Gennaro, T. Roschuk, S. Maier, R. Oulton

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引用次数: 0

摘要

我们展示了一种利用非相干白光测量金属纳米粒子显微镜物镜色差的新方法。当通过透镜的焦平面扫描单个纳米粒子时，记录消光光谱。通过分析每个扫描位置的扫描消光光谱和整个扫描的峰值消光之间的变化，我们显示了焦波长和纵向色焦移之间的直接相关性。用纳米铝颗粒在消色差物镜和消色差物镜上进行了实验。

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Measuring chromatic aberration in imaging systems using plasmonic nano-particles

We demonstrate a novel method to measure chromatic aberrations of microscope objectives with metallic nano-particles using incoherent white light. Extinction spectra are recorded while scanning a single nano-particle through a lens's focal plane. We show a direct correlation between the focal wavelength and the longitudinal chromatic focal shift through analysis of the variations between scanned extinction spectra at each scan position and peak extinction over the entire scan. The method has been tested on achromat and apochromat objectives using aluminum nano-particles.

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2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS)

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