光学镊子中的荧光支持

J. G. Animas, M. Arronte, T. Flores, L. Ponce
{"title":"光学镊子中的荧光支持","authors":"J. G. Animas, M. Arronte, T. Flores, L. Ponce","doi":"10.1117/12.2016447","DOIUrl":null,"url":null,"abstract":"This paper presents the development of an installation for proves for characterization by fluorescence of micrometer and nanometer particles supported on the trapping and manipulation by optical trapping technique (optical tweezers). The system features an laser operating at 480 nm, CCD camera for image acquisition, Thor Labs micrometric table X, Y, Z for the movement of the sample and the trap in the visual field. The design includes the use of intensity modulated optical trap, with the option of being used in pulsed, opening up possibilities for the use of resonant phenomena optomechanical type for particle capture.","PeriodicalId":135913,"journal":{"name":"Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fluorescence support in optical tweezers\",\"authors\":\"J. G. Animas, M. Arronte, T. Flores, L. Ponce\",\"doi\":\"10.1117/12.2016447\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the development of an installation for proves for characterization by fluorescence of micrometer and nanometer particles supported on the trapping and manipulation by optical trapping technique (optical tweezers). The system features an laser operating at 480 nm, CCD camera for image acquisition, Thor Labs micrometric table X, Y, Z for the movement of the sample and the trap in the visual field. The design includes the use of intensity modulated optical trap, with the option of being used in pulsed, opening up possibilities for the use of resonant phenomena optomechanical type for particle capture.\",\"PeriodicalId\":135913,\"journal\":{\"name\":\"Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2016447\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2016447","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文介绍了一种基于光学捕获技术(光镊)捕获和操纵的微米和纳米粒子荧光表征验证装置的开发。该系统的特点是一个工作在480nm的激光器,用于图像采集的CCD相机,Thor Labs的X, Y, Z测微台用于样品的运动和视野中的陷阱。该设计包括使用强度调制光阱,可选择用于脉冲,为使用共振现象光机械类型进行粒子捕获开辟了可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fluorescence support in optical tweezers
This paper presents the development of an installation for proves for characterization by fluorescence of micrometer and nanometer particles supported on the trapping and manipulation by optical trapping technique (optical tweezers). The system features an laser operating at 480 nm, CCD camera for image acquisition, Thor Labs micrometric table X, Y, Z for the movement of the sample and the trap in the visual field. The design includes the use of intensity modulated optical trap, with the option of being used in pulsed, opening up possibilities for the use of resonant phenomena optomechanical type for particle capture.
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