纳米级电路应用的优化GSDG MOSFET设计

D. Arar, M. Meguellat, M. Chahdi
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引用次数: 3

摘要

本文采用多目标遗传算法(MOGAs)对栅极堆叠双栅(GSDG) MOSFET的关键电参数行为进行了研究和优化。跨导和关断电流是关键的电学参数,由饱和区和亚阈值区解析表达式确定。利用优化设计来研究和证明所提出的技术对纳米电子器件的影响。在此背景下,我们建议研究环形振荡器和逆变器门这两个电路的电学性能,以证明所提出的方法在集成电路设计上的效率。在这项研究中,记录了振荡频率和增益电压的重要改进。所获得的结果使所提出的设计成为纳米电子应用的另一种解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An optimized GSDG MOSFET design for nanoscale circuit applications
In this paper, the key electrical parameters behavior of Gate Stack Double Gate (GSDG) MOSFET are studied and optimized using multi-objective genetic algorithms (MOGAs) for nanoscale CMOS-based applications. The transconductance and the OFF-current are the key electrical parameters which have been determined by the analytical explicit expressions in saturation and subthreshold regions. The optimized design is used to investigate and demonstrate the impact of the proposed technique on the nanoelectronic devices. In this context, we proposed to investigate the electrical performance of the both circuits, the ring oscillator and the inverter gate, in order to demonstrate the efficiency of the proposed method on the integrated circuit design. In this study an important improvement of the oscillation frequency and gain voltage have been recorded. The obtained results make the proposed design an alternative solution for nanoelectronics applications.
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