CdZnTe探测器电极触头失效分析

Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Pub Date : 2006-06-27 DOI:10.1109/HDP.2006.1707612

T. Jianyong, Sang Wen-bin, Qin Kaifeng, Min Jiahua, Xia Jun

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引用次数: 1

摘要

研究了三种不同工艺沉积的金触头在加速老化试验前后的特性。实验结果表明，老化会导致接触界面的连续性、粘附强度和欧姆特性等性能的下降，特别是热真空沉积的接触界面会影响CdZnTe探测器的性能

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Failure analysis of the CdZnTe detector electrode contacts

The characteristics of the Au contacts deposited by three different processes before and after accelerating aging tests have been investigated in this paper. The experimental results indicate that the aging tests can cause the degradation of the contact interfacial properties, such as continuities, adhesion strength and ohmic characteristics, especially for the contact interface deposited by the thermal vacuum processing, which would influence the performance of CdZnTe detectors

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Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.

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