{"title":"用于光纤通信系统的长寿命高亮度led","authors":"S. Hersee","doi":"10.1109/IEDM.1977.189322","DOIUrl":null,"url":null,"abstract":"The degradation of high radiance LEDs has been characterised over a range of operating temperatures. It is shown that the decay is due to two independant mechanisms. The first mechanism relies on the movement of a charged species in the vicinity of the junction region. The second involves the breakdown of the p-side contact, followed by the diffusion of gold to the active region. The latter mechanism is expected to limit the device lifetime to approximately 106hours. An improved p-side metallisation is discussed.","PeriodicalId":218912,"journal":{"name":"1977 International Electron Devices Meeting","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Long lived high radiance LEDs for fibre optic communications systems\",\"authors\":\"S. Hersee\",\"doi\":\"10.1109/IEDM.1977.189322\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The degradation of high radiance LEDs has been characterised over a range of operating temperatures. It is shown that the decay is due to two independant mechanisms. The first mechanism relies on the movement of a charged species in the vicinity of the junction region. The second involves the breakdown of the p-side contact, followed by the diffusion of gold to the active region. The latter mechanism is expected to limit the device lifetime to approximately 106hours. An improved p-side metallisation is discussed.\",\"PeriodicalId\":218912,\"journal\":{\"name\":\"1977 International Electron Devices Meeting\",\"volume\":\"87 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1977 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1977.189322\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1977 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1977.189322","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Long lived high radiance LEDs for fibre optic communications systems
The degradation of high radiance LEDs has been characterised over a range of operating temperatures. It is shown that the decay is due to two independant mechanisms. The first mechanism relies on the movement of a charged species in the vicinity of the junction region. The second involves the breakdown of the p-side contact, followed by the diffusion of gold to the active region. The latter mechanism is expected to limit the device lifetime to approximately 106hours. An improved p-side metallisation is discussed.