Lily Huang, Michael R. Smith, Albert Tran, James Miller
{"title":"基于锁集的嵌入式产品数据竞争检测的硬件辅助方法E-RACE","authors":"Lily Huang, Michael R. Smith, Albert Tran, James Miller","doi":"10.1109/ISSRE.2008.23","DOIUrl":null,"url":null,"abstract":"Limited research exists for identifying data races under the specific characteristics found in embedded systems. E-RACE is a new style of data-race identification tool which directly utilizes specialized hardware capabilities to monitor the flow of data and instructions. Compared to existing data race analysis approaches, the hardware-assisted E-RACE tool has advantages of recognizing data-race issues without requiring extensive software code instrumentation. The tool is integrated into an Embedded Unit Testing Driven Development Framework to encourage the construction of testable code and early identification of data-races.","PeriodicalId":448275,"journal":{"name":"2008 19th International Symposium on Software Reliability Engineering (ISSRE)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"E-RACE, A Hardware-Assisted Approach to Lockset-Based Data Race Detection for Embedded Products\",\"authors\":\"Lily Huang, Michael R. Smith, Albert Tran, James Miller\",\"doi\":\"10.1109/ISSRE.2008.23\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Limited research exists for identifying data races under the specific characteristics found in embedded systems. E-RACE is a new style of data-race identification tool which directly utilizes specialized hardware capabilities to monitor the flow of data and instructions. Compared to existing data race analysis approaches, the hardware-assisted E-RACE tool has advantages of recognizing data-race issues without requiring extensive software code instrumentation. The tool is integrated into an Embedded Unit Testing Driven Development Framework to encourage the construction of testable code and early identification of data-races.\",\"PeriodicalId\":448275,\"journal\":{\"name\":\"2008 19th International Symposium on Software Reliability Engineering (ISSRE)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 19th International Symposium on Software Reliability Engineering (ISSRE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSRE.2008.23\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 19th International Symposium on Software Reliability Engineering (ISSRE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.2008.23","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
E-RACE, A Hardware-Assisted Approach to Lockset-Based Data Race Detection for Embedded Products
Limited research exists for identifying data races under the specific characteristics found in embedded systems. E-RACE is a new style of data-race identification tool which directly utilizes specialized hardware capabilities to monitor the flow of data and instructions. Compared to existing data race analysis approaches, the hardware-assisted E-RACE tool has advantages of recognizing data-race issues without requiring extensive software code instrumentation. The tool is integrated into an Embedded Unit Testing Driven Development Framework to encourage the construction of testable code and early identification of data-races.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
