基于BIT的航天器测试设备可测试性设计

Yang Zhao, He Liu, Rui Li, Xiaojun Han, Chun Zhang, Naihai Li
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引用次数: 0

摘要

本文分析了深空航天器综合测试系统中供配电、测控、控推进等前端专用设备的需求,研究了设备内置测试(BIT)的可测试性设计方法。主要包括板卡关键电路的可测试性设计和板卡与设备之间的设备端口信号设计。对模拟输入/输出和数字输入/输出信号进行多种BIT模型的设计,实现信号的无损或低损耗实时监控。设计了BIT功能应用的验证环境,验证了BIT设计在标准模式和失效模式下的正确性。为无人值守状态下空间设备的实时健康诊断和故障预警提供了一种技术手段。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Testability design of spacecraft test equipment based on BIT
In this paper, the requirements of power supply and distribution, measurement and control, control and propulsion and other front-end special equipment in the integrated test system of deep space spacecrafts are analyzed, and the testability design method of built-in-test (BIT) of the equipment is studied. It mainly includes the testability design of the key circuit of the board and the device port signal between board and device. Carry out various design of BIT models of analog input / output and digital input / output signals to realize non-destructive or low-loss real-time monitoring of signals. This paper designs a verification environment for BIT function application, and verifies the correctness of BIT design for standard mode and failure mode. It provides a technical method for real-time health diagnosis and failure warning of space equipment in unattended condition.
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