{"title":"基于28nm UTBB-FDSOI的6T SRAM单元流水2R/1W存储器设计","authors":"Ramandeep Kaur, Alexander Fell, Harsh Rawat","doi":"10.1109/SOCC.2015.7406973","DOIUrl":null,"url":null,"abstract":"Multi-port Static Random Access Memories (SRAM) are essential for shared data structures, especially in distributed, multi-core and multi-processing computing systems. This paper introduces an elementary multi-port memory design which can perform either dual-read or a single-write operation (2R/1W) by efficiently combining the 6 Transistor (6T) single-port SRAM (SP-SRAM). This new architecture offers a solution to the existing 8T dual-port (DP) cell problems including read-write stability issues. The design has been evaluated by comparing with the conventional solutions, in 28nm Ultra Thin Body and Box Fully Depleted Silicon on Insulator (UTBB-FDSOI) technology. A 2048 words, 64 bit memory shows 31% improvement in performance, 31% reduced area and 19% lesser power consumption than the conventional 8T dual-port SRAM (DP-SRAM). In addition, the proposed design is scalable to large memory capacities which cannot be generated directly using the available dual-port memory compilers.","PeriodicalId":329464,"journal":{"name":"2015 28th IEEE International System-on-Chip Conference (SOCC)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A 6T SRAM cell based pipelined 2R/1W memory design using 28nm UTBB-FDSOI\",\"authors\":\"Ramandeep Kaur, Alexander Fell, Harsh Rawat\",\"doi\":\"10.1109/SOCC.2015.7406973\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Multi-port Static Random Access Memories (SRAM) are essential for shared data structures, especially in distributed, multi-core and multi-processing computing systems. This paper introduces an elementary multi-port memory design which can perform either dual-read or a single-write operation (2R/1W) by efficiently combining the 6 Transistor (6T) single-port SRAM (SP-SRAM). This new architecture offers a solution to the existing 8T dual-port (DP) cell problems including read-write stability issues. The design has been evaluated by comparing with the conventional solutions, in 28nm Ultra Thin Body and Box Fully Depleted Silicon on Insulator (UTBB-FDSOI) technology. A 2048 words, 64 bit memory shows 31% improvement in performance, 31% reduced area and 19% lesser power consumption than the conventional 8T dual-port SRAM (DP-SRAM). In addition, the proposed design is scalable to large memory capacities which cannot be generated directly using the available dual-port memory compilers.\",\"PeriodicalId\":329464,\"journal\":{\"name\":\"2015 28th IEEE International System-on-Chip Conference (SOCC)\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 28th IEEE International System-on-Chip Conference (SOCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOCC.2015.7406973\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 28th IEEE International System-on-Chip Conference (SOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOCC.2015.7406973","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 6T SRAM cell based pipelined 2R/1W memory design using 28nm UTBB-FDSOI
Multi-port Static Random Access Memories (SRAM) are essential for shared data structures, especially in distributed, multi-core and multi-processing computing systems. This paper introduces an elementary multi-port memory design which can perform either dual-read or a single-write operation (2R/1W) by efficiently combining the 6 Transistor (6T) single-port SRAM (SP-SRAM). This new architecture offers a solution to the existing 8T dual-port (DP) cell problems including read-write stability issues. The design has been evaluated by comparing with the conventional solutions, in 28nm Ultra Thin Body and Box Fully Depleted Silicon on Insulator (UTBB-FDSOI) technology. A 2048 words, 64 bit memory shows 31% improvement in performance, 31% reduced area and 19% lesser power consumption than the conventional 8T dual-port SRAM (DP-SRAM). In addition, the proposed design is scalable to large memory capacities which cannot be generated directly using the available dual-port memory compilers.