{"title":"根据时间需求验证响应式嵌入式系统","authors":"J. Strug, S. Deniziak, K. Sapiecha","doi":"10.1109/ECBS.2004.1316694","DOIUrl":null,"url":null,"abstract":"Efficient methods of automatic generation of test scenarios to validate a system against functional requirements have already been developed. However, there are no such satisfactory methods as far as temporal requirements are concerned. A method of automatic generation of test scenarios for verification of time constraints for reactive embedded systems is presented.","PeriodicalId":137219,"journal":{"name":"Proceedings. 11th IEEE International Conference and Workshop on the Engineering of Computer-Based Systems, 2004.","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Validation of reactive embedded systems against temporal requirements\",\"authors\":\"J. Strug, S. Deniziak, K. Sapiecha\",\"doi\":\"10.1109/ECBS.2004.1316694\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Efficient methods of automatic generation of test scenarios to validate a system against functional requirements have already been developed. However, there are no such satisfactory methods as far as temporal requirements are concerned. A method of automatic generation of test scenarios for verification of time constraints for reactive embedded systems is presented.\",\"PeriodicalId\":137219,\"journal\":{\"name\":\"Proceedings. 11th IEEE International Conference and Workshop on the Engineering of Computer-Based Systems, 2004.\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 11th IEEE International Conference and Workshop on the Engineering of Computer-Based Systems, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECBS.2004.1316694\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 11th IEEE International Conference and Workshop on the Engineering of Computer-Based Systems, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECBS.2004.1316694","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Validation of reactive embedded systems against temporal requirements
Efficient methods of automatic generation of test scenarios to validate a system against functional requirements have already been developed. However, there are no such satisfactory methods as far as temporal requirements are concerned. A method of automatic generation of test scenarios for verification of time constraints for reactive embedded systems is presented.