{"title":"DUT雷达截面与TEM细胞反应效应的相互作用","authors":"D. Pouhè, G. Monich","doi":"10.1109/EMCZUR.2007.4388283","DOIUrl":null,"url":null,"abstract":"A simple novel approach for an efficient investigation of the interactions between the DUT and the cell is provided. Closed-form expressions for the reflection coefficient, the relative deviation in field and the relative error in induced current caused by the reactive effect of the cell are derived. Each of these expressions encompasses both the mutual influence of the DUT’s RCS and the reactive effect of the cell. It is shown that, depending on the frequency dependent phase factor ejͨ, strong and weak test conditions may occur since the overall incident field will exhibit maxima and minima. Hence evidence showing that the total incident field impinging on the DUT generally deviates from the primary excited TEM field is provided.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On the interaction between the DUT’s radar cross section and the reactive effect of TEM cells\",\"authors\":\"D. Pouhè, G. Monich\",\"doi\":\"10.1109/EMCZUR.2007.4388283\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A simple novel approach for an efficient investigation of the interactions between the DUT and the cell is provided. Closed-form expressions for the reflection coefficient, the relative deviation in field and the relative error in induced current caused by the reactive effect of the cell are derived. Each of these expressions encompasses both the mutual influence of the DUT’s RCS and the reactive effect of the cell. It is shown that, depending on the frequency dependent phase factor ejͨ, strong and weak test conditions may occur since the overall incident field will exhibit maxima and minima. Hence evidence showing that the total incident field impinging on the DUT generally deviates from the primary excited TEM field is provided.\",\"PeriodicalId\":397061,\"journal\":{\"name\":\"2007 18th International Zurich Symposium on Electromagnetic Compatibility\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 18th International Zurich Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCZUR.2007.4388283\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2007.4388283","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On the interaction between the DUT’s radar cross section and the reactive effect of TEM cells
A simple novel approach for an efficient investigation of the interactions between the DUT and the cell is provided. Closed-form expressions for the reflection coefficient, the relative deviation in field and the relative error in induced current caused by the reactive effect of the cell are derived. Each of these expressions encompasses both the mutual influence of the DUT’s RCS and the reactive effect of the cell. It is shown that, depending on the frequency dependent phase factor ejͨ, strong and weak test conditions may occur since the overall incident field will exhibit maxima and minima. Hence evidence showing that the total incident field impinging on the DUT generally deviates from the primary excited TEM field is provided.