紧凑全区域MOSFET模型:理论与应用

C. Galup-Montoro, M. C. Schneider
{"title":"紧凑全区域MOSFET模型:理论与应用","authors":"C. Galup-Montoro, M. C. Schneider","doi":"10.1109/NEWCAS.2018.8585657","DOIUrl":null,"url":null,"abstract":"A compact presentation of the basic theory of the MOS transistor is given. Instead of the usual approach of furnishing separate analytical formulas for the strong and weak inversion regions of the MOS transistor, we provide simple formulas which are valid in all operating regions, including moderate inversion. We review ultra-low-power circuits operating near the threshold condition that allow the automatic extraction of the specific current IS and the threshold voltage VT of MOS transistors, which are the most fundamental parameters for technology characterization, circuit design, and testing.","PeriodicalId":112526,"journal":{"name":"2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"The compact all-region MOSFET model: theory and applications\",\"authors\":\"C. Galup-Montoro, M. C. Schneider\",\"doi\":\"10.1109/NEWCAS.2018.8585657\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A compact presentation of the basic theory of the MOS transistor is given. Instead of the usual approach of furnishing separate analytical formulas for the strong and weak inversion regions of the MOS transistor, we provide simple formulas which are valid in all operating regions, including moderate inversion. We review ultra-low-power circuits operating near the threshold condition that allow the automatic extraction of the specific current IS and the threshold voltage VT of MOS transistors, which are the most fundamental parameters for technology characterization, circuit design, and testing.\",\"PeriodicalId\":112526,\"journal\":{\"name\":\"2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEWCAS.2018.8585657\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEWCAS.2018.8585657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

简要介绍了MOS晶体管的基本原理。不同于通常为MOS晶体管的强反转区和弱反转区分别提供解析公式的方法,我们提供了适用于所有工作区域的简单公式,包括中等反转。我们回顾了在阈值条件附近工作的超低功耗电路,这些电路可以自动提取MOS晶体管的特定电流IS和阈值电压VT,这是技术表征,电路设计和测试的最基本参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The compact all-region MOSFET model: theory and applications
A compact presentation of the basic theory of the MOS transistor is given. Instead of the usual approach of furnishing separate analytical formulas for the strong and weak inversion regions of the MOS transistor, we provide simple formulas which are valid in all operating regions, including moderate inversion. We review ultra-low-power circuits operating near the threshold condition that allow the automatic extraction of the specific current IS and the threshold voltage VT of MOS transistors, which are the most fundamental parameters for technology characterization, circuit design, and testing.
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