零静态功率4T SRAM,具有自抑制电阻开关负载,采用纯CMOS逻辑工艺

C. Liao, Meng-Yin Hsu, Y. Chih, Jonathan Chang, Y. King, C. Lin
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引用次数: 9

摘要

在纯40nm CMOS逻辑制程中成功演示了一种完全逻辑兼容的4T2R非易失性静态随机存取存储器(nv-SRAM)。这种非易失性SRAM由两个嵌入在4T SRAM中的STI rram组成,具有最小的面积损失和完全的逻辑兼容性。通过SRAM单元访问数据,并通过独特的自抑制功能切换其中一个加载rram来存储数据。使用这种嵌入式STI RRAM存储节点,可以在断电模式下以零静态功率保存数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Zero static-power 4T SRAM with self-inhibit resistive switching load by pure CMOS logic process
A full logic compatible 4T2R nonvolatile Static Random Access Memory (nv-SRAM) is successfully demonstrated in pure 40nm CMOS logic process. This non-volatile SRAM consists of two STI RRAMs embedded inside the 4T SRAM with minimal area penalty and full logic compatibility. Data is accessed through SRAM cells, and stored by switching one of the loading RRAMs by an unique self-inhibit feature. With this embedded STI RRAM storage nodes, data can be held under power-off mode with zero static power.
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