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引用次数: 5
摘要
提出了一种利用具有敏化输入对的输入序列对进行顺序电路多故障诊断的方法。这代表了我们先前处理组合电路的工作的扩展(N. Yanagida et al., 1995)。在回顾前人方法的基础上,我们引入了一种具有敏化输入对的输入序列对来诊断分子电路的顺序电路中的多个故障。我们称这样的输入序列对为敏化序列对。接下来,我们将前面的方法用于组合电路扩展到顺序电路。该方法根据敏化序列对产生的敏化路径与子电路之间的关系,在不探测任何内线的情况下,根据在主输出处观察到的响应逐一推断出子电路的可疑故障。本文首次提供了在不探查内线、不进行故障模拟、不进行故障枚举的情况下,采用时序电路诊断方法对ISCAS电路进行诊断的实验报告。
Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs
The paper presents an approach to multiple fault diagnosis in sequential circuits by using input sequence pairs having sensitizing input pairs. This represents an extension of our previous work dealing with combinational circuits (N. Yanagida et al., 1995). After reviewing our previous method, we introduce an input sequence pair having sensitizing input pairs to diagnose multiple faults in a sequential circuit partitioned into subcircuits. We call such an input sequence pair, the sensitizing sequence pair. Next, we extend the use of the previous method for combinational circuits to sequential circuits. From a relation between a sensitizing path generated by a sensitizing sequence pair and a subcircuit, the proposed method deduces the suspected faults for the subcircuits, one by one, based on the responses observed at primary outputs without probing any internal line. The paper provides the first experimental reports on diagnostic results of the ISCAS circuits by using our diagnostic method for sequential circuits, without probing any internal line, any fault simulation, or fault enumeration.