用于研究和教学的多栅极NMOS工艺的开发

D. Langford, K. Rambo, T. Fox, T. Back, C. Pañeda
{"title":"用于研究和教学的多栅极NMOS工艺的开发","authors":"D. Langford, K. Rambo, T. Fox, T. Back, C. Pañeda","doi":"10.1109/UGIM.1991.148120","DOIUrl":null,"url":null,"abstract":"An integrated circuit fabrication facility has been developed at the University of Florida which is suitable for undergraduate laboratories, research in process technology, and studies in DFM (design for manufacturability). The NMOS process described represents the first step toward the long-range goal of developing a CMOS technology. The design goals for the University of Florida NMOS (UF NMOS) process were to check the performance limits of the fabrication facilities and to develop a process flow which could be integrated into a one semester undergraduate laboratory. Processing capabilities include ion implantation and low-pressure chemical vapor deposition (LPCVD) of polysilicon and silicon dioxide. The availability of these processes allows design of an all-implanted technology including threshold-adjustment implants and polysilicon gates with a self-aligned MOS structure. The process description is given. Process design tools and layout tools are described. Testing procedures are outlined, and the laboratory implementation is discussed. Measured data flow from NMOS devices are included.<<ETX>>","PeriodicalId":163406,"journal":{"name":"Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of a poly-gate NMOS process for research and teaching\",\"authors\":\"D. Langford, K. Rambo, T. Fox, T. Back, C. Pañeda\",\"doi\":\"10.1109/UGIM.1991.148120\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An integrated circuit fabrication facility has been developed at the University of Florida which is suitable for undergraduate laboratories, research in process technology, and studies in DFM (design for manufacturability). The NMOS process described represents the first step toward the long-range goal of developing a CMOS technology. The design goals for the University of Florida NMOS (UF NMOS) process were to check the performance limits of the fabrication facilities and to develop a process flow which could be integrated into a one semester undergraduate laboratory. Processing capabilities include ion implantation and low-pressure chemical vapor deposition (LPCVD) of polysilicon and silicon dioxide. The availability of these processes allows design of an all-implanted technology including threshold-adjustment implants and polysilicon gates with a self-aligned MOS structure. The process description is given. Process design tools and layout tools are described. Testing procedures are outlined, and the laboratory implementation is discussed. Measured data flow from NMOS devices are included.<<ETX>>\",\"PeriodicalId\":163406,\"journal\":{\"name\":\"Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/UGIM.1991.148120\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/UGIM.1991.148120","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

佛罗里达大学开发了一种集成电路制造设备,适用于本科实验室、工艺技术研究和DFM(可制造性设计)研究。所描述的NMOS工艺代表了开发CMOS技术的长期目标的第一步。佛罗里达大学NMOS (UF NMOS)工艺的设计目标是检查制造设备的性能限制,并开发一个可以集成到一个学期的本科实验室的工艺流程。加工能力包括离子注入和多晶硅和二氧化硅的低压化学气相沉积(LPCVD)。这些工艺的可用性允许设计全植入技术,包括阈值调整植入物和具有自对准MOS结构的多晶硅栅极。给出了工艺流程说明。介绍了工艺设计工具和布局工具。测试程序概述,并讨论了实验室实施。包括来自NMOS器件的测量数据流。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of a poly-gate NMOS process for research and teaching
An integrated circuit fabrication facility has been developed at the University of Florida which is suitable for undergraduate laboratories, research in process technology, and studies in DFM (design for manufacturability). The NMOS process described represents the first step toward the long-range goal of developing a CMOS technology. The design goals for the University of Florida NMOS (UF NMOS) process were to check the performance limits of the fabrication facilities and to develop a process flow which could be integrated into a one semester undergraduate laboratory. Processing capabilities include ion implantation and low-pressure chemical vapor deposition (LPCVD) of polysilicon and silicon dioxide. The availability of these processes allows design of an all-implanted technology including threshold-adjustment implants and polysilicon gates with a self-aligned MOS structure. The process description is given. Process design tools and layout tools are described. Testing procedures are outlined, and the laboratory implementation is discussed. Measured data flow from NMOS devices are included.<>
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