电子器件的瞬态响应及其失效机理

Proceedings of the International Conference on Electromagnetic Interference and Compatibility Pub Date : 1900-01-01 DOI:10.1109/ICEMIC.1999.871691

S. Tyagi

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引用次数: 3

摘要

本文介绍了电子系统中一些常用元器件在出现暂态时的失效机理。从理论上估计，低功率晶体管和微波混频器二极管最容易受到能量为1 /spl mu/J数量级甚至更小的输入瞬态的影响。

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Transient response of electronic devices and their failure mechanism

The paper presents the failure mechanism of some of the commonly used components in electronic systems when transients appear upon them. It is estimated theoretically that low power transistors and microwave mixer diode are most susceptible to incoming transients with energy of the order of 1 /spl mu/J or even less.

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Proceedings of the International Conference on Electromagnetic Interference and Compatibility

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