自动生成多端口sram的March测试

Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06) Pub Date : 2006-01-17 DOI:10.1109/DELTA.2006.17

A. Benso, A. Bosio, S. Carlo, G. D. Natale, P. Prinetto

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引用次数: 7

摘要

多端口ram (Multi-Port sram)的测试需要特殊的测试，因为多端口同时访问会对故障敏感，这与传统的单端口内存故障不同。尽管它们的应用越来越广泛，但很少有关于测试MP记忆的作品发表。此外，大多数已发表的工作只集中在两个端口存储器(即2P存储器)上。本文提出了一种自动生成行军测试的方法。它首先是基于几代单端口内存行军测试，然后将其扩展到通用的MP sram测试。一组实验结果表明了该方法的有效性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Automatic March tests generation for multi-port SRAMs

Testing of Multi-Port (MP) SRAMs requires special tests since the multiple and simultaneous access can sensitize faults that are different from the conventional single-port memory faults. In spite of their growing use, few works have been published on testing MP memories. In addition, most of the published work concentrated only on two ports memories (i.e., 2P memories). This paper presents a methodology to automatically generate march tests for MP memories. It is based on generations of single port memory march test firstly, then extending it to test a generic MP SRAMs. A set of experimental results shows the effectiveness of the proposed solution.

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Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)

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