模拟电路中参数故障的可检测性研究

Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors Pub Date : 2002-09-16 DOI:10.1109/ICCD.2002.1106781

J. Savir, Zhen Guo

引用次数: 22

摘要

研究了线性时不变模拟电路中参数故障的可检测性。我们表明，在模拟故障检测方面存在固有的局限性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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On the detectability of parametric faults in analog circuits

This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog fault detectability.

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来源期刊

Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors

CiteScore

2.30

自引率

0.00%

发文量