{"title":"作为诊断或制造工具的光伏组件暗电流-电压测量","authors":"D. King, B. Hansen, J. Kratochvil, M. Quintana","doi":"10.1109/PVSC.1997.654286","DOIUrl":null,"url":null,"abstract":"Dark current-voltage (dark I-V) measurements are commonly used to analyze the electrical characteristics of solar cells, providing an effective way to determine fundamental performance parameters without the need for a solar simulator. The dark I-V measurement procedure does not provide information regarding short-circuit current, but is more sensitive than light I-V measurements in determining the other parameters (series resistance, shunt resistance, diode factor and diode saturation currents) that dictate the electrical performance of a photovoltaic device. The work documented here extends the use of dark I-V measurements to photovoltaic modules, illustrates their use in diagnosing module performance losses and proposes their use for process monitoring during manufacturing.","PeriodicalId":251166,"journal":{"name":"Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997","volume":"88 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"80","resultStr":"{\"title\":\"Dark current-voltage measurements on photovoltaic modules as a diagnostic or manufacturing tool\",\"authors\":\"D. King, B. Hansen, J. Kratochvil, M. Quintana\",\"doi\":\"10.1109/PVSC.1997.654286\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dark current-voltage (dark I-V) measurements are commonly used to analyze the electrical characteristics of solar cells, providing an effective way to determine fundamental performance parameters without the need for a solar simulator. The dark I-V measurement procedure does not provide information regarding short-circuit current, but is more sensitive than light I-V measurements in determining the other parameters (series resistance, shunt resistance, diode factor and diode saturation currents) that dictate the electrical performance of a photovoltaic device. The work documented here extends the use of dark I-V measurements to photovoltaic modules, illustrates their use in diagnosing module performance losses and proposes their use for process monitoring during manufacturing.\",\"PeriodicalId\":251166,\"journal\":{\"name\":\"Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997\",\"volume\":\"88 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"80\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.1997.654286\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.1997.654286","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dark current-voltage measurements on photovoltaic modules as a diagnostic or manufacturing tool
Dark current-voltage (dark I-V) measurements are commonly used to analyze the electrical characteristics of solar cells, providing an effective way to determine fundamental performance parameters without the need for a solar simulator. The dark I-V measurement procedure does not provide information regarding short-circuit current, but is more sensitive than light I-V measurements in determining the other parameters (series resistance, shunt resistance, diode factor and diode saturation currents) that dictate the electrical performance of a photovoltaic device. The work documented here extends the use of dark I-V measurements to photovoltaic modules, illustrates their use in diagnosing module performance losses and proposes their use for process monitoring during manufacturing.