{"title":"一个电流补偿基准振荡器","authors":"Wan-Jing Li, Soon-Jyh Chang, Ying-Zu Lin","doi":"10.1109/VDAT.2009.5158112","DOIUrl":null,"url":null,"abstract":"This paper reports a reliable current compensated reference oscillator without any BJT or external component. To maintain a stable oscillation frequency, the discharging current of the proposed architecture varies with process, supply voltage and temperature (PVT) variations. Fabricated in a 0.18-µm digital CMOS process, this oscillator consumes 0.5 mW from a 1.8..V supply. The post-simulation results show the worst case is 12%. From 500 times Monte Carlo simulation results, the frequency variations are all limited within ±3%. The measurement result of ten samples at room temperature with 10% supply voltage deviation shows variation within ±10%. The maximum variation is –10.19% with process and supply voltage variations from measurement results.","PeriodicalId":246670,"journal":{"name":"2009 International Symposium on VLSI Design, Automation and Test","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A current compensated reference oscillator\",\"authors\":\"Wan-Jing Li, Soon-Jyh Chang, Ying-Zu Lin\",\"doi\":\"10.1109/VDAT.2009.5158112\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper reports a reliable current compensated reference oscillator without any BJT or external component. To maintain a stable oscillation frequency, the discharging current of the proposed architecture varies with process, supply voltage and temperature (PVT) variations. Fabricated in a 0.18-µm digital CMOS process, this oscillator consumes 0.5 mW from a 1.8..V supply. The post-simulation results show the worst case is 12%. From 500 times Monte Carlo simulation results, the frequency variations are all limited within ±3%. The measurement result of ten samples at room temperature with 10% supply voltage deviation shows variation within ±10%. The maximum variation is –10.19% with process and supply voltage variations from measurement results.\",\"PeriodicalId\":246670,\"journal\":{\"name\":\"2009 International Symposium on VLSI Design, Automation and Test\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Symposium on VLSI Design, Automation and Test\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VDAT.2009.5158112\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VDAT.2009.5158112","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper reports a reliable current compensated reference oscillator without any BJT or external component. To maintain a stable oscillation frequency, the discharging current of the proposed architecture varies with process, supply voltage and temperature (PVT) variations. Fabricated in a 0.18-µm digital CMOS process, this oscillator consumes 0.5 mW from a 1.8..V supply. The post-simulation results show the worst case is 12%. From 500 times Monte Carlo simulation results, the frequency variations are all limited within ±3%. The measurement result of ten samples at room temperature with 10% supply voltage deviation shows variation within ±10%. The maximum variation is –10.19% with process and supply voltage variations from measurement results.