液氦中正离子迁移率密度依赖的新模型

F. Aitken, N. Bonifaci, A. Denat, K. von Haeften
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引用次数: 0

摘要

自由体积模型在过去已被成功地用于计算液体和固体的离子电导率。我们最近应用这种方法计算了液态氦和超临界氦中的电子迁移率和电子空腔半径。我们的方法的一个关键步骤是发展范德华式状态方程,其中适当选择了描述流体和杂质之间吸引力的内部压力表达式。在这里,我们进一步发展这种方法来研究正离子。我们发现正离子的内部压强比电子的内部压强简单得多。用我们的方法计算的1 ~ 100 bar压力下的离子迁移率与2.2、3和4.2 K压力下的实验数据吻合得很好。随压力或密度的变化,与迁移率值相关的半径从0.55 nm到0.4 nm不等。在液氦中,正离子形成“阿特金斯雪球”,在这种结构中,正核从其溶剂化壳中吸引氦原子,形成致密的固体状填充层。该界面的氦密度分布图比氦中的电子腔要尖锐得多,并且导致正杂质的可压缩性较低。我们相信,这种更清晰的密度分布是内部压力比电子更简单的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A new model for the density-dependence of positive ion mobility in liquid helium
The free volume model has in the past been used to calculate ionic conductivities of liquids and solids successfully. We have recently applied this method to calculate electron mobilities and electron cavity radii in liquid and supercritical helium. A key step in our approach is the development of van der Waals-type state equation with an appropriately chosen expression for the internal pressure describing the attraction between fluid and impurities. Here we develop this approach further to study positive ions. We find for positive ions a much simpler form of the internal pressure than for electrons. The ion mobility calculated with our method for pressures between 1 and 100 bar agree very well with experimental data recorded at 2.2, 3 and 4.2 K. The radii associated with mobility values vary from 0.55 nm to 0.4 nm with pressure or density. In liquid helium, positive ions form ‘Atkins’ snowballs, a structure in which a positive core attracts the helium atoms from its solvation shell to form a densely, solid-like packed layer. The helium density profile of this interface is much sharper than for electron cavities in helium and gives rise to a lower compressibility of the positive impurity. We believe that this sharper density profile is the reason for the much simpler form of the internal pressure than for electrons.
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