GaAs mmic的氢降解及密闭封装中的氢演化

IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers Pub Date : 1995-05-15 DOI:10.1109/MCS.1995.470977

Y. Saito, R. Griese, J. Kessler, R. Kono, J. Fang

{"title":"GaAs mmic的氢降解及密闭封装中的氢演化","authors":"Y. Saito, R. Griese, J. Kessler, R. Kono, J. Fang","doi":"10.1109/MCS.1995.470977","DOIUrl":null,"url":null,"abstract":"An investigation of hydrogen degradation of GaAs MMICs (MESFET, PHEMT and HBT) was conducted to determine the threshold hydrogen concentration for spacecraft application. The maximum hydrogen in the hermetic package is found to be 0.6 torr (based on 10 year mission at ambient temperature of 125/spl deg/C). Hydrogen evolution in hermetic package is also studied to determine the source of hydrogen and to minimize its level in the package. Both studies demonstrate the high reliability of hermetic A40 (Al/Si) and Kovar (Fe/Ni/Co) packages for spacecraft applications.<<ETX>>","PeriodicalId":325779,"journal":{"name":"IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Hydrogen degradation of GaAs MMICs and hydrogen evolution in the hermetic package\",\"authors\":\"Y. Saito, R. Griese, J. Kessler, R. Kono, J. Fang\",\"doi\":\"10.1109/MCS.1995.470977\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An investigation of hydrogen degradation of GaAs MMICs (MESFET, PHEMT and HBT) was conducted to determine the threshold hydrogen concentration for spacecraft application. The maximum hydrogen in the hermetic package is found to be 0.6 torr (based on 10 year mission at ambient temperature of 125/spl deg/C). Hydrogen evolution in hermetic package is also studied to determine the source of hydrogen and to minimize its level in the package. Both studies demonstrate the high reliability of hermetic A40 (Al/Si) and Kovar (Fe/Ni/Co) packages for spacecraft applications.<<ETX>>\",\"PeriodicalId\":325779,\"journal\":{\"name\":\"IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MCS.1995.470977\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCS.1995.470977","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 14

摘要

研究了MESFET、PHEMT和HBT三种GaAs mmic材料的氢降解特性，确定了用于航天器的阈值氢浓度。密封封装中的最大氢被发现为0.6 torr(基于环境温度为125/spl℃的10年任务)。研究了密闭容器内氢气的演化过程，以确定氢气的来源，并尽量减少氢气在密闭容器内的含量。两项研究都证明了密封式A40 (Al/Si)和Kovar (Fe/Ni/Co)封装在航天器应用中的高可靠性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Hydrogen degradation of GaAs MMICs and hydrogen evolution in the hermetic package

An investigation of hydrogen degradation of GaAs MMICs (MESFET, PHEMT and HBT) was conducted to determine the threshold hydrogen concentration for spacecraft application. The maximum hydrogen in the hermetic package is found to be 0.6 torr (based on 10 year mission at ambient temperature of 125/spl deg/C). Hydrogen evolution in hermetic package is also studied to determine the source of hydrogen and to minimize its level in the package. Both studies demonstrate the high reliability of hermetic A40 (Al/Si) and Kovar (Fe/Ni/Co) packages for spacecraft applications.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

IEEE 1995 Microwave and Millimeter-Wave. Monolithic Circuits Symposium. Digest of Papers

自引率

0.00%

发文量