{"title":"三维环带结构近场增强的定位","authors":"P. Micek, P. Gašo, D. Pudiš","doi":"10.1109/ASDAM55965.2022.9966787","DOIUrl":null,"url":null,"abstract":"This work deals with a simulation-based design and near-field optical microscopy measurement of IP-Dip photoresist near-field probe consisting of a series of elevated ring zone plates. The height increment implemented into the ring zone plates effectively suppresses the diffraction phenomena resulting in a narrow emission of the evanescent and propagating modes along the optical axis.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Localization of the near-field enhancement by 3D ring-zone structure\",\"authors\":\"P. Micek, P. Gašo, D. Pudiš\",\"doi\":\"10.1109/ASDAM55965.2022.9966787\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work deals with a simulation-based design and near-field optical microscopy measurement of IP-Dip photoresist near-field probe consisting of a series of elevated ring zone plates. The height increment implemented into the ring zone plates effectively suppresses the diffraction phenomena resulting in a narrow emission of the evanescent and propagating modes along the optical axis.\",\"PeriodicalId\":148302,\"journal\":{\"name\":\"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASDAM55965.2022.9966787\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM55965.2022.9966787","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Localization of the near-field enhancement by 3D ring-zone structure
This work deals with a simulation-based design and near-field optical microscopy measurement of IP-Dip photoresist near-field probe consisting of a series of elevated ring zone plates. The height increment implemented into the ring zone plates effectively suppresses the diffraction phenomena resulting in a narrow emission of the evanescent and propagating modes along the optical axis.