{"title":"复杂嵌入式系统和微系统的可靠性评估","authors":"O. Malasse, G. Buchheit, M. Pock, M. Walter","doi":"10.1109/RAMS.2010.5447976","DOIUrl":null,"url":null,"abstract":"The evaluation of the dependability performance (RAMS) of complex embedded systems requires the development of new approaches. In software-intensive systems, the dependability structure of the functions depends on the software. The search of fault sequences must involve software and hardware. The proposed method contributes to the qualitative and quantitative safety analysis of systems and micro-systems.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Dependability evaluation of complex embedded systems and microsystems\",\"authors\":\"O. Malasse, G. Buchheit, M. Pock, M. Walter\",\"doi\":\"10.1109/RAMS.2010.5447976\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The evaluation of the dependability performance (RAMS) of complex embedded systems requires the development of new approaches. In software-intensive systems, the dependability structure of the functions depends on the software. The search of fault sequences must involve software and hardware. The proposed method contributes to the qualitative and quantitative safety analysis of systems and micro-systems.\",\"PeriodicalId\":299782,\"journal\":{\"name\":\"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.2010.5447976\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2010.5447976","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dependability evaluation of complex embedded systems and microsystems
The evaluation of the dependability performance (RAMS) of complex embedded systems requires the development of new approaches. In software-intensive systems, the dependability structure of the functions depends on the software. The search of fault sequences must involve software and hardware. The proposed method contributes to the qualitative and quantitative safety analysis of systems and micro-systems.