18b 5 MS/s SAR ADC,动态范围100.2 dB

A. Bannon, Christopher P. Hurrell, Derek Hummerston, C. Lyden
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引用次数: 42

摘要

本文介绍了一种18位5毫秒/秒的SAR ADC。它的动态范围为100.2 dB,信噪比为99 dB, INL为±2 ppm, DNL为±0.4 ppm。据作者所知,相对于满量程输入(21.9 nV/√Hz,±5V满量程),它是目前所有单片奈奎斯特转换器中最低的本底噪声,所有这些都是在ADC核心功率为30.52 mW的情况下实现的,施瑞尔优值为179.3 dB[1]。架构选择,如使用残留放大器概述,使高采样率,低噪声和功率效率。该设计在0.18 μm CMOS上实现,采用MIM电容和1.8 V和5 V MOS器件。LVDS接口用于将ADC结果传输到片外。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An 18 b 5 MS/s SAR ADC with 100.2 dB dynamic range
This paper presents an 18 bit 5 MS/s SAR ADC. It has a dynamic range of 100.2 dB, SNR of 99 dB, INL of ±2 ppm and DNL of ±0.4 ppm. It has currently the lowest noise floor of any monolithic Nyquist converter relative to the full scale input (21.9 nV/√Hz, ±5V full scale) known to the author, all of this is achieved with an ADC core power of 30.52 mW giving a Schreier figure of merit of 179.3 dB [1]. Architectural choices such as the use of a residue amplifier are outlined that enable the high sample rate, low noise and power efficiency. The design is implemented on 0.18 μm CMOS with MIM capacitors and both 1.8 V and 5 V MOS devices. An LVDS interface is used to transfer the ADC result off chip.
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