重离子辐照下二次离子诱导多细胞破坏的实验与模拟研究

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI:10.1109/RADECS50773.2020.9857709

A. M. Galimov, Alexey I. Gukov, Andrey A. Klyayn, Alexandr E. Koziukov

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引用次数: 0

摘要

在40 nm SRAM的重离子背面辐照实验中，观察到二次离子冲击可能引起的多重细胞紊乱。通过Geant4仿真来评估此类事件发生的概率。

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Experimental and Simulation Study of Secondary Ion-Induced Multiple Cell Upsets under Heavy Ion Irradiation

Multiple cell upsets potentially caused by secondary ion impact were observed in the heavy ion backside irradiation experiment of 40 nm SRAM. Geant4 simulation was carried out to evaluate the occurrence probability of such events.

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2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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