{"title":"基于BP神经网络的NAMP故障诊断技术","authors":"Jianfeng Nan, Rong Fan, Chuang Guo","doi":"10.1109/ICINIS.2008.55","DOIUrl":null,"url":null,"abstract":"In allusion to the insufficiency of the Built-in-test-equipment (BITE) of NAMP and the ground fault diagnosis equipment, the fault diagnosis theory and methods for a certain type NAMP based on BP neural network are investigated, and the fault diagnosis example is provided with the typical test item. The technology simplifies the structure of the fault diagnosis system, and has a farther effective distinguish from the source of fault diagnosed by BITE, and isolates the fault from the LRU level to the SRU level.","PeriodicalId":185739,"journal":{"name":"2008 First International Conference on Intelligent Networks and Intelligent Systems","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fault Diagnosis Technology for NAMP Based on BP Neural Network\",\"authors\":\"Jianfeng Nan, Rong Fan, Chuang Guo\",\"doi\":\"10.1109/ICINIS.2008.55\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In allusion to the insufficiency of the Built-in-test-equipment (BITE) of NAMP and the ground fault diagnosis equipment, the fault diagnosis theory and methods for a certain type NAMP based on BP neural network are investigated, and the fault diagnosis example is provided with the typical test item. The technology simplifies the structure of the fault diagnosis system, and has a farther effective distinguish from the source of fault diagnosed by BITE, and isolates the fault from the LRU level to the SRU level.\",\"PeriodicalId\":185739,\"journal\":{\"name\":\"2008 First International Conference on Intelligent Networks and Intelligent Systems\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 First International Conference on Intelligent Networks and Intelligent Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICINIS.2008.55\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 First International Conference on Intelligent Networks and Intelligent Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICINIS.2008.55","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault Diagnosis Technology for NAMP Based on BP Neural Network
In allusion to the insufficiency of the Built-in-test-equipment (BITE) of NAMP and the ground fault diagnosis equipment, the fault diagnosis theory and methods for a certain type NAMP based on BP neural network are investigated, and the fault diagnosis example is provided with the typical test item. The technology simplifies the structure of the fault diagnosis system, and has a farther effective distinguish from the source of fault diagnosed by BITE, and isolates the fault from the LRU level to the SRU level.