用于SPDT开关高隔离和低插入损耗的双谐振腔拓扑结构

Rakhi Kumari, Vijesh Arora, S. Bhalke
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引用次数: 1

摘要

在单极双通(SPDT)开关中,采用双谐振腔拓扑结构实现高隔离和低插入损耗。该SPDT开关基于GaAs MESFET,工作在8至11 GHz频段。该电路经过调谐,在9-10 GHz频段提供最佳的极高隔离和低插入损耗。它采用一个串联分支和三个并联分支。一个串联和一个并联分支电容通过并联电感谐振出来。制作了该电路并进行了性能测试。该MMIC SPDT开关在9-10 GHz频段的插入损耗低于2 dB,隔离度优于46 dB;在8-11 GHz频段的插入损耗低于2.2 dB,隔离度优于42 dB。该电路必须与其他组件集成才能演示x波段核心芯片。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Double Resonator Topology for High Isolation and Low Insertion Loss in SPDT Switch
In this paper Double Resonator Topology is used to achieve high isolation and low insertion loss in single pole double through (SPDT) switch. This SPDT switch is based on GaAs MESFET and operates in the band of 8 to 11 GHz. This circuit is tuned to give optimum very high isolation and low insertion loss in 9-10 GHz frequency band. It uses one series and three shunt branches. One series and one shunt branch capacitances are resonated out with parallel inductance. This circuit is fabricated and performance measured. The measured performance of this MMIC SPDT switch has insertion loss lower than 2 dB and isolation better than 46 dB in 9-10 GHz and insertion loss lower than 2.2 dB and isolation better than 42 dB in 8-11 GHz. This circuit has to be integrated with other component to demonstrate X-band core chip.
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