Essam Berikaa, Santiago Bernal, Mustafa Hammood, L. Chrostowski, D. Plant
{"title":"容错多尖端反锥形氮化硅边耦合器","authors":"Essam Berikaa, Santiago Bernal, Mustafa Hammood, L. Chrostowski, D. Plant","doi":"10.1109/IPC53466.2022.9975570","DOIUrl":null,"url":null,"abstract":"This work presents the design and characterization of multi-tip SiN inverse tapered edge couplers. Our measurements and simulations show that increasing the number of tips effectively improves the horizontal misalignment tolerance compared to conventional linear tapered edge couplers.","PeriodicalId":202839,"journal":{"name":"2022 IEEE Photonics Conference (IPC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Misalignment-Tolerant Multi-Tip Inverse Tapered Silicon Nitride Edge Couplers\",\"authors\":\"Essam Berikaa, Santiago Bernal, Mustafa Hammood, L. Chrostowski, D. Plant\",\"doi\":\"10.1109/IPC53466.2022.9975570\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents the design and characterization of multi-tip SiN inverse tapered edge couplers. Our measurements and simulations show that increasing the number of tips effectively improves the horizontal misalignment tolerance compared to conventional linear tapered edge couplers.\",\"PeriodicalId\":202839,\"journal\":{\"name\":\"2022 IEEE Photonics Conference (IPC)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Photonics Conference (IPC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPC53466.2022.9975570\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Photonics Conference (IPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPC53466.2022.9975570","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This work presents the design and characterization of multi-tip SiN inverse tapered edge couplers. Our measurements and simulations show that increasing the number of tips effectively improves the horizontal misalignment tolerance compared to conventional linear tapered edge couplers.