{"title":"碳纳米管浆料的电子场发射优化","authors":"Y. Kim, K. Sohn, Y. Cho, E. Yoo","doi":"10.1109/IVNC.2004.1354999","DOIUrl":null,"url":null,"abstract":"Photosensitive organic binder was mixed with well-dispersed arc discharged single-walled carbon nanotubes (CNTs). The CNT-paste was screen-printed on the Cr-patterned glass substrate. Following back-side UV exposure, binder burn-out processes were carried out for accurate and fine patterning of paste. Emission images were obtained from a cathode successively: (a) as-prepared, (b) just after rubber-roll treatment and (c) after multiple I-V cycling. Improvement of emission properties with I-V cycling was observed from scanning electron micrographs (SEM) and I-V curves. The morphology of printed-CNTs was remarkably changed after I-V cycling. Parallel alignment of CNTs to the field direction become permanent after multiple field emission cycles. The field emission threshold was about 2.5 V/spl middot//spl mu/m/sup -1/ for the first measurement. In the successive emission cycles, the threshold fields decreased gradually to 1.9 V/spl middot//spl mu/m/sup -1/ for the final 13/sup th/ cycle. From the corresponding Fowler-Nordheim plots, the field enhancement factor (/spl beta/) of each line was evaluated. The average /spl beta/ values monotonically increased (from 1366 to 2120) with field emission repetition, which again confirmed the gradual vertical alignment of CNTs by multiple I-V cycles.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Optimization of electron field emission from carbon nanotube paste\",\"authors\":\"Y. Kim, K. Sohn, Y. Cho, E. Yoo\",\"doi\":\"10.1109/IVNC.2004.1354999\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Photosensitive organic binder was mixed with well-dispersed arc discharged single-walled carbon nanotubes (CNTs). The CNT-paste was screen-printed on the Cr-patterned glass substrate. Following back-side UV exposure, binder burn-out processes were carried out for accurate and fine patterning of paste. Emission images were obtained from a cathode successively: (a) as-prepared, (b) just after rubber-roll treatment and (c) after multiple I-V cycling. Improvement of emission properties with I-V cycling was observed from scanning electron micrographs (SEM) and I-V curves. The morphology of printed-CNTs was remarkably changed after I-V cycling. Parallel alignment of CNTs to the field direction become permanent after multiple field emission cycles. The field emission threshold was about 2.5 V/spl middot//spl mu/m/sup -1/ for the first measurement. In the successive emission cycles, the threshold fields decreased gradually to 1.9 V/spl middot//spl mu/m/sup -1/ for the final 13/sup th/ cycle. From the corresponding Fowler-Nordheim plots, the field enhancement factor (/spl beta/) of each line was evaluated. The average /spl beta/ values monotonically increased (from 1366 to 2120) with field emission repetition, which again confirmed the gradual vertical alignment of CNTs by multiple I-V cycles.\",\"PeriodicalId\":137345,\"journal\":{\"name\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2004.1354999\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2004.1354999","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optimization of electron field emission from carbon nanotube paste
Photosensitive organic binder was mixed with well-dispersed arc discharged single-walled carbon nanotubes (CNTs). The CNT-paste was screen-printed on the Cr-patterned glass substrate. Following back-side UV exposure, binder burn-out processes were carried out for accurate and fine patterning of paste. Emission images were obtained from a cathode successively: (a) as-prepared, (b) just after rubber-roll treatment and (c) after multiple I-V cycling. Improvement of emission properties with I-V cycling was observed from scanning electron micrographs (SEM) and I-V curves. The morphology of printed-CNTs was remarkably changed after I-V cycling. Parallel alignment of CNTs to the field direction become permanent after multiple field emission cycles. The field emission threshold was about 2.5 V/spl middot//spl mu/m/sup -1/ for the first measurement. In the successive emission cycles, the threshold fields decreased gradually to 1.9 V/spl middot//spl mu/m/sup -1/ for the final 13/sup th/ cycle. From the corresponding Fowler-Nordheim plots, the field enhancement factor (/spl beta/) of each line was evaluated. The average /spl beta/ values monotonically increased (from 1366 to 2120) with field emission repetition, which again confirmed the gradual vertical alignment of CNTs by multiple I-V cycles.