光子集成电路中的多值逻辑物理不可克隆函数

D. MacFarlane, H. Shahoei, Ifeanyi G. Achu, Evan J Stewart, Wiliam V. Oxford, Mitchell A. Thornton
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引用次数: 0

摘要

物理不可克隆功能(PUF)光电路被描述并在光子集成电路(PIC)中实现,以增强某些安全属性,如设备认证,防篡改属性,或用作信任根值。光学处理对于诸如此类的安全应用是有利的,因为它们不易受到窃听和侧信道监控,因为在PIC操作期间难以观察电磁辐射发射。我们使用输出极化状态(SOP)可变性引起的固有应力,应变和制造公差存在于制造PIC中。我们的PUF电路中使用了定制的光信号处理元件,该元件包含一个非常窄的“沟槽”结构,在制造过程中产生微小的结构变化,从而增强了SOP的可变性。制造的光子晶体的微小结构变化是固定的,导致光信号的可重复的SOP变化。为了避免PUF校准的需要,为了增加对输入功率电平变化的鲁棒性,测量设备的分辨率和灵敏度;我们证明PUF功能可以方便地建模为离散的多重评估逻辑(MVL)函数。所提出的MVL PUF配方避免了表征和测量精确偏振状态的需要,也使PUF输出测量设备的使用具有广泛的分辨率和灵敏度规格。几个不同的PUF电路实现在一个单一的制造PIC和实验评估,以证明其有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Multiple-Valued Logic Physically Unclonable Function in Photonic Integrated Circuits
Physically Unclonable Function (PUF) optical circuits are described and implemented within a Photonic Integrated Circuit (PIC) to enhance certain security properties such as device authentication, anti-tamper properties, or for use as a root-of-trust value. Optical processing is advantageous for security applications such as these since they are less susceptible to eavesdropping and side channel monitoring via the difficulty of observing electromagnetic radiation emissions during PIC operation. We employ the use of State of Output Polarization (SOP) variability arising from inherent stresses, strains and manufacturing tolerances present within a fabricated PIC. A customized optical signal processing element is used in our PUF circuit that contains a very narrow "trench" structure with tiny structural variations induced during fabrication that enhances SOP variability. The tiny structural changes in fabricated PICs are fixed resulting in repeatable SOP variation of the optical signals. To avoid a need for PUF calibration, to increase robustness with respect to input power level variation, measurement device resolution and sensitivity; we show that PUF functionality can be conveniently modeled as a discrete MultipleValued Logic (MVL) function. The proposed MVL PUF formulation avoids the need to characterize and measure exact polarization states as well as enabling the use of PUF output measurement devices that have a wide range of resolution and sensitivity specifications. Several different PUF circuits are implemented within a single fabricated PIC and are experimentally evaluated to demonstrate its efficacy.
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