亚微米尺度氮化镓的光增强湿法蚀刻

J. Škriniarová, A. van der Hart, H. Bochem, A. Fox, P. Kordos
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引用次数: 1

摘要

在汞氙弧灯照射下,在KOH基溶液中对蓝宝石表面生长的n掺杂氮化镓层进行了光辅助电化学刻蚀。在狭窄的蚀刻条件下获得了光滑的表面。通过使用产生“晶须”的蚀刻条件,可以扩大这一范围。随后在显影剂az400k和KOH溶液中进行后处理,去除这些晶须,减少沟槽壁的纤维质地。这可以在PEC蚀刻表面上提供光滑的侧壁。经过优化的PEC工艺,成功地获得了500 nm宽的GaN沟槽。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Photoenhanced wet etching of gallium nitride on submicrometer scale
Photoassisted electrochemical (PEC) etching of n-doped GaN layer grown on sapphire in the KOH based solution under illumination by a mercury-xenon-arc lamp is demonstrated. Smooth surfaces were obtained for a narrow range of etching conditions. It was found that this range could be extended by using etch conditions which produced "whiskers". Subsequent post treatment in developer AZ 400K and KOH solution were used to remove these whiskers and reduced fibrous texture of the grooves walls. This can provide a smooth sidewall on the PEC etched surface. As a result of optimized PEC process 500 nm wide grooves in GaN were successfully obtained.
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