J. Škriniarová, A. van der Hart, H. Bochem, A. Fox, P. Kordos
{"title":"亚微米尺度氮化镓的光增强湿法蚀刻","authors":"J. Škriniarová, A. van der Hart, H. Bochem, A. Fox, P. Kordos","doi":"10.1109/ASDAM.2002.1088525","DOIUrl":null,"url":null,"abstract":"Photoassisted electrochemical (PEC) etching of n-doped GaN layer grown on sapphire in the KOH based solution under illumination by a mercury-xenon-arc lamp is demonstrated. Smooth surfaces were obtained for a narrow range of etching conditions. It was found that this range could be extended by using etch conditions which produced \"whiskers\". Subsequent post treatment in developer AZ 400K and KOH solution were used to remove these whiskers and reduced fibrous texture of the grooves walls. This can provide a smooth sidewall on the PEC etched surface. As a result of optimized PEC process 500 nm wide grooves in GaN were successfully obtained.","PeriodicalId":179900,"journal":{"name":"The Fourth International Conference on Advanced Semiconductor Devices and Microsystem","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Photoenhanced wet etching of gallium nitride on submicrometer scale\",\"authors\":\"J. Škriniarová, A. van der Hart, H. Bochem, A. Fox, P. Kordos\",\"doi\":\"10.1109/ASDAM.2002.1088525\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Photoassisted electrochemical (PEC) etching of n-doped GaN layer grown on sapphire in the KOH based solution under illumination by a mercury-xenon-arc lamp is demonstrated. Smooth surfaces were obtained for a narrow range of etching conditions. It was found that this range could be extended by using etch conditions which produced \\\"whiskers\\\". Subsequent post treatment in developer AZ 400K and KOH solution were used to remove these whiskers and reduced fibrous texture of the grooves walls. This can provide a smooth sidewall on the PEC etched surface. As a result of optimized PEC process 500 nm wide grooves in GaN were successfully obtained.\",\"PeriodicalId\":179900,\"journal\":{\"name\":\"The Fourth International Conference on Advanced Semiconductor Devices and Microsystem\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Fourth International Conference on Advanced Semiconductor Devices and Microsystem\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASDAM.2002.1088525\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Fourth International Conference on Advanced Semiconductor Devices and Microsystem","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM.2002.1088525","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Photoenhanced wet etching of gallium nitride on submicrometer scale
Photoassisted electrochemical (PEC) etching of n-doped GaN layer grown on sapphire in the KOH based solution under illumination by a mercury-xenon-arc lamp is demonstrated. Smooth surfaces were obtained for a narrow range of etching conditions. It was found that this range could be extended by using etch conditions which produced "whiskers". Subsequent post treatment in developer AZ 400K and KOH solution were used to remove these whiskers and reduced fibrous texture of the grooves walls. This can provide a smooth sidewall on the PEC etched surface. As a result of optimized PEC process 500 nm wide grooves in GaN were successfully obtained.