ZnO压敏电阻的降解及其介电弛豫

Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) Pub Date : 1993-10-17 DOI:10.1109/CEIDP.1993.378916

H. Wang, Y. Xu

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引用次数: 2

摘要

利用介电弛豫谱研究了ZnO压敏电阻在8/20/spl mu/s脉冲电流作用下的衰减。研究了介电弛豫谱与迁移离子分布的关系。介质弛豫测量是研究非欧姆氧化锌陶瓷降解的可靠方法。在脉冲电流的作用下，介质损耗频谱向低频区偏移。这种位移是由于间隙的迁移在晶界上形成了等效偶极子。

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Degradation of ZnO varistor and its dielectric relaxation

Dielectric relaxation spectra are used to study the degradation of a ZnO varistor under 8/20/spl mu/s impulse current. The relationship between dielectric relaxation spectra and the distribution of migration ions is investigated. Dielectric-relaxation measurement is shown to be a reliable method for studying the degradation of non-Ohmic ZnO ceramics. The frequency spectra of dielectric loss are shifted to low-frequency regions after stressing by impulse current. The shift is attributed to the formation of equivalent dipoles in the grain boundary by the migration of interstitials.<>

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Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)

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