{"title":"金属探测器头部分析","authors":"Zhuoran Tang, L. Carter","doi":"10.1109/ICSENST.2011.6137076","DOIUrl":null,"url":null,"abstract":"Metal-detector performance depends heavily on the sensor head. Errors in coil placement within the head can lead to degradation in detector performance. Electromagnetic modelling of typical very-low-frequency detector heads shows the effect of coil placement errors on detector sensitivity. Provided the bucking coil ‘tracks’ the receive coil, required error corrections can remain small.","PeriodicalId":202062,"journal":{"name":"2011 Fifth International Conference on Sensing Technology","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Metal detector head analysis\",\"authors\":\"Zhuoran Tang, L. Carter\",\"doi\":\"10.1109/ICSENST.2011.6137076\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Metal-detector performance depends heavily on the sensor head. Errors in coil placement within the head can lead to degradation in detector performance. Electromagnetic modelling of typical very-low-frequency detector heads shows the effect of coil placement errors on detector sensitivity. Provided the bucking coil ‘tracks’ the receive coil, required error corrections can remain small.\",\"PeriodicalId\":202062,\"journal\":{\"name\":\"2011 Fifth International Conference on Sensing Technology\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 Fifth International Conference on Sensing Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSENST.2011.6137076\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Fifth International Conference on Sensing Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSENST.2011.6137076","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Metal-detector performance depends heavily on the sensor head. Errors in coil placement within the head can lead to degradation in detector performance. Electromagnetic modelling of typical very-low-frequency detector heads shows the effect of coil placement errors on detector sensitivity. Provided the bucking coil ‘tracks’ the receive coil, required error corrections can remain small.
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