{"title":"发射限制静电雾化和精细结构常数","authors":"A. J. Kelly","doi":"10.1116/1.1990123","DOIUrl":null,"url":null,"abstract":"Quadropole mass spectrometer measurements are obtained for charged Octoil sprays, at a droplet radius of 0.83 /spl mu/m. Data are obtained for both emission limit and Rayleigh limit regime. The data revealed that operation in the emission limited regime is a function of inverse relative dielectric constant, coupling parameter r/sub s/, and the inverse fine structure constant f. The values r/sub s/ and f and their ratio (r/sub s//f) involve Planck's constant, indicating that emission limited spraying is controlled by quantum mechanical processes. The relationship between the energy per surface charge with the droplet diameter of Octoil is also shown.","PeriodicalId":137345,"journal":{"name":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Emission limited electrostatic atomization and the fine structure constant\",\"authors\":\"A. J. Kelly\",\"doi\":\"10.1116/1.1990123\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quadropole mass spectrometer measurements are obtained for charged Octoil sprays, at a droplet radius of 0.83 /spl mu/m. Data are obtained for both emission limit and Rayleigh limit regime. The data revealed that operation in the emission limited regime is a function of inverse relative dielectric constant, coupling parameter r/sub s/, and the inverse fine structure constant f. The values r/sub s/ and f and their ratio (r/sub s//f) involve Planck's constant, indicating that emission limited spraying is controlled by quantum mechanical processes. The relationship between the energy per surface charge with the droplet diameter of Octoil is also shown.\",\"PeriodicalId\":137345,\"journal\":{\"name\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1116/1.1990123\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1116/1.1990123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Emission limited electrostatic atomization and the fine structure constant
Quadropole mass spectrometer measurements are obtained for charged Octoil sprays, at a droplet radius of 0.83 /spl mu/m. Data are obtained for both emission limit and Rayleigh limit regime. The data revealed that operation in the emission limited regime is a function of inverse relative dielectric constant, coupling parameter r/sub s/, and the inverse fine structure constant f. The values r/sub s/ and f and their ratio (r/sub s//f) involve Planck's constant, indicating that emission limited spraying is controlled by quantum mechanical processes. The relationship between the energy per surface charge with the droplet diameter of Octoil is also shown.