{"title":"软x射线显微镜和太赫兹成像对印刷线路板上枝晶的分析:离子迁移过程中枝晶的结构","authors":"K. Mitobe, Masafumi Suzuki, N. Yoshimura","doi":"10.1109/ICPES.2011.6156691","DOIUrl":null,"url":null,"abstract":"Ion migration that causes short circuit to an insulated printed wiring board (PWB) occurs in highly humid environment under electrical field. In this paper, water drop test (WDT) method was used as an acceleration test of ion migration. We have investigated the dendrite using three different bands of electromagnetic wave, x-ray, visible light and THz wave. As the results, THz imaging system is superior to find the dendrite because the deposited metal has highly reflectance against the THz wave.","PeriodicalId":158903,"journal":{"name":"2011 International Conference on Power and Energy Systems","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of the dendrite on printed wiring board by soft X-ray microscope and THz imaging: Structure of the dendrite in Ion-migration\",\"authors\":\"K. Mitobe, Masafumi Suzuki, N. Yoshimura\",\"doi\":\"10.1109/ICPES.2011.6156691\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ion migration that causes short circuit to an insulated printed wiring board (PWB) occurs in highly humid environment under electrical field. In this paper, water drop test (WDT) method was used as an acceleration test of ion migration. We have investigated the dendrite using three different bands of electromagnetic wave, x-ray, visible light and THz wave. As the results, THz imaging system is superior to find the dendrite because the deposited metal has highly reflectance against the THz wave.\",\"PeriodicalId\":158903,\"journal\":{\"name\":\"2011 International Conference on Power and Energy Systems\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 International Conference on Power and Energy Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICPES.2011.6156691\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Conference on Power and Energy Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPES.2011.6156691","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
在电场作用下的高湿度环境中，离子迁移会导致绝缘印制板(PWB)短路。本文采用水滴试验(water drop test, WDT)法作为离子迁移的加速试验。我们用三个不同波段的电磁波，x射线，可见光和太赫兹波来研究树突。结果表明，由于沉积金属对太赫兹波的高反射率，太赫兹成像系统在寻找枝晶方面具有优势。
Analysis of the dendrite on printed wiring board by soft X-ray microscope and THz imaging: Structure of the dendrite in Ion-migration
Ion migration that causes short circuit to an insulated printed wiring board (PWB) occurs in highly humid environment under electrical field. In this paper, water drop test (WDT) method was used as an acceleration test of ion migration. We have investigated the dendrite using three different bands of electromagnetic wave, x-ray, visible light and THz wave. As the results, THz imaging system is superior to find the dendrite because the deposited metal has highly reflectance against the THz wave.
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