{"title":"砷化镓中光激发电子的迁移寿命积","authors":"G. Valley, H. Rajbenbach, H. Bardeleben","doi":"10.1063/1.102786","DOIUrl":null,"url":null,"abstract":"Application of large DC and AC fields to undoped semi-insulating GaAs to enhance its photorefractive performance leads to improvement compared to no applied field, but the improvement is not nearly as large as predicted theoretically when zero-field values of the mobility-lifetime product are used in the calculations. For example, Fig. 1 shows the gain coefficient as a function of grating period when an AC electric field is applied to the sample.1 The dashed lines are theoretical predictions based on a mobility of 5000 cm2/V-sec (from the Hall mobility of an adjacent sample) and a carrier lifetime of 30 nanoseconds (based on literature values for the recombination cross section of electrons to the EL2* level2). The solid lines are based on a mobility lifetime product four orders of magnitude smaller.","PeriodicalId":385625,"journal":{"name":"Topical Meeting on Photorefractive Materials, Effects, and Devices II","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"Mobility-lifetime product of photoexcited electrons in GaAs\",\"authors\":\"G. Valley, H. Rajbenbach, H. Bardeleben\",\"doi\":\"10.1063/1.102786\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Application of large DC and AC fields to undoped semi-insulating GaAs to enhance its photorefractive performance leads to improvement compared to no applied field, but the improvement is not nearly as large as predicted theoretically when zero-field values of the mobility-lifetime product are used in the calculations. For example, Fig. 1 shows the gain coefficient as a function of grating period when an AC electric field is applied to the sample.1 The dashed lines are theoretical predictions based on a mobility of 5000 cm2/V-sec (from the Hall mobility of an adjacent sample) and a carrier lifetime of 30 nanoseconds (based on literature values for the recombination cross section of electrons to the EL2* level2). The solid lines are based on a mobility lifetime product four orders of magnitude smaller.\",\"PeriodicalId\":385625,\"journal\":{\"name\":\"Topical Meeting on Photorefractive Materials, Effects, and Devices II\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-01-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Topical Meeting on Photorefractive Materials, Effects, and Devices II\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1063/1.102786\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Topical Meeting on Photorefractive Materials, Effects, and Devices II","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.102786","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Mobility-lifetime product of photoexcited electrons in GaAs
Application of large DC and AC fields to undoped semi-insulating GaAs to enhance its photorefractive performance leads to improvement compared to no applied field, but the improvement is not nearly as large as predicted theoretically when zero-field values of the mobility-lifetime product are used in the calculations. For example, Fig. 1 shows the gain coefficient as a function of grating period when an AC electric field is applied to the sample.1 The dashed lines are theoretical predictions based on a mobility of 5000 cm2/V-sec (from the Hall mobility of an adjacent sample) and a carrier lifetime of 30 nanoseconds (based on literature values for the recombination cross section of electrons to the EL2* level2). The solid lines are based on a mobility lifetime product four orders of magnitude smaller.