不同铜含量的喷涂CZTS薄膜的研究

M. Sekkati, E. Benamar, Taoufik Slimani Tlemcani, M. Taibi, S. Aazou, Z. Edfouf, F. C. El Moursli, G. Schmerber, Z. Sekkat, A. Dinia, A. Slaoui, M. Abd-lefdil
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引用次数: 1

摘要

采用超声喷涂的方法,在Mo涂层上沉积了CZTS薄膜。在500℃氩气气氛下进行了1小时的系统硫化处理。通过x射线衍射、拉曼光谱和透射率测量研究了1µm左右CZTS薄膜的铜含量效应。在铜含量高、铜含量低的情况下,薄膜虽有二次相存在,但仍呈现出kesterite结构。间隙能值对铜含量敏感,在1.42 ~ 1.68 eV之间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study of sprayed CZTS thin films containing various copper content
By ultrasonic spray, we have deposited CZTS films on Mo coated substrates. A sulfurization treatment was systematically performed under Argon atmosphere at 500 °C for one hour. Copper content effect of CZTS thin films of about 1 µm was studied by X-ray diffraction, Raman spectroscopy and optical transmittance measurements. The films exhibited the kesterite structure despite the appearance of some secondary phases for a high and poor copper content. The gap energy value was sensitive to the copper content and ranged between 1.42 eV and 1.68 eV.
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