使用改进的捕获-再捕获模型进行顺序检查的缺陷估计方法

Ching-Pao Chang, Jia-Lyn Lv, Chih-Ping Chu
{"title":"使用改进的捕获-再捕获模型进行顺序检查的缺陷估计方法","authors":"Ching-Pao Chang, Jia-Lyn Lv, Chih-Ping Chu","doi":"10.1109/COMPSAC.2005.19","DOIUrl":null,"url":null,"abstract":"Defect prediction is an important process in the evaluation of software quality. To accurately predict the rate of software defects can not only facilitate software review decisions, but can also improve software quality. In this paper, we have provided a defect estimation approach, which uses defective data from sequential inspections to increase the accuracy of estimating defects. To demonstrate potential improvements, the results of our approach were compared to those of two other popular estimation approaches, the capture-recapture model and the re-inspection model. By using the proposed approach, software organizations may increase the accuracy of their defect predictions and reduce the effort of subsequent inspections.","PeriodicalId":419267,"journal":{"name":"29th Annual International Computer Software and Applications Conference (COMPSAC'05)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A defect estimation approach for sequential inspection using a modified capture-recapture model\",\"authors\":\"Ching-Pao Chang, Jia-Lyn Lv, Chih-Ping Chu\",\"doi\":\"10.1109/COMPSAC.2005.19\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Defect prediction is an important process in the evaluation of software quality. To accurately predict the rate of software defects can not only facilitate software review decisions, but can also improve software quality. In this paper, we have provided a defect estimation approach, which uses defective data from sequential inspections to increase the accuracy of estimating defects. To demonstrate potential improvements, the results of our approach were compared to those of two other popular estimation approaches, the capture-recapture model and the re-inspection model. By using the proposed approach, software organizations may increase the accuracy of their defect predictions and reduce the effort of subsequent inspections.\",\"PeriodicalId\":419267,\"journal\":{\"name\":\"29th Annual International Computer Software and Applications Conference (COMPSAC'05)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-07-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th Annual International Computer Software and Applications Conference (COMPSAC'05)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/COMPSAC.2005.19\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th Annual International Computer Software and Applications Conference (COMPSAC'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMPSAC.2005.19","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

缺陷预测是软件质量评估中的一个重要环节。准确地预测软件的缺陷率不仅可以方便软件评审决策,而且可以提高软件质量。在本文中,我们提供了一种缺陷估计方法,该方法使用来自顺序检查的缺陷数据来提高缺陷估计的准确性。为了证明潜在的改进,我们的方法的结果与另外两种流行的估计方法,捕获-再捕获模型和重新检查模型进行了比较。通过使用建议的方法,软件组织可以提高缺陷预测的准确性,并减少后续检查的工作量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A defect estimation approach for sequential inspection using a modified capture-recapture model
Defect prediction is an important process in the evaluation of software quality. To accurately predict the rate of software defects can not only facilitate software review decisions, but can also improve software quality. In this paper, we have provided a defect estimation approach, which uses defective data from sequential inspections to increase the accuracy of estimating defects. To demonstrate potential improvements, the results of our approach were compared to those of two other popular estimation approaches, the capture-recapture model and the re-inspection model. By using the proposed approach, software organizations may increase the accuracy of their defect predictions and reduce the effort of subsequent inspections.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信