{"title":"基于频率值的PRAM存储器结构","authors":"Guangyu Sun, Dimin Niu, J. Ouyang, Yuan Xie","doi":"10.1109/ASPDAC.2011.5722186","DOIUrl":null,"url":null,"abstract":"Phase Change Random Access Memory (PRAM) has great potential as the replacement of DRAM as main memory, due to its advantages of high density, non-volatility, fast read speed, and excellent scalability. However, poor endurance and high write energy appear to be the challenges to be tackled before PRAM can be adopted as main memory. In order to mitigate these limitations, prior research focuses on reducing write intensity at the bit level. In this work, we study the data pattern of memory write operations, and explore the frequent-value locality in data written back to main memory. Based on the fact that many data are written to memory repeatedly, an architecture of frequent-value storage is proposed for PRAM memory. It can significantly reduce the write intensity to PRAM memory so that the lifetime is improved and the write energy is reduced. The trade-off between endurance and capacity of PRAM memory is explored for different configurations. After using the frequent-value storage, the endurance of PRAM is improved to about 1.6X on average, and the write energy is reduced by 20%.","PeriodicalId":316253,"journal":{"name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"52","resultStr":"{\"title\":\"A frequent-value based PRAM memory architecture\",\"authors\":\"Guangyu Sun, Dimin Niu, J. Ouyang, Yuan Xie\",\"doi\":\"10.1109/ASPDAC.2011.5722186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Phase Change Random Access Memory (PRAM) has great potential as the replacement of DRAM as main memory, due to its advantages of high density, non-volatility, fast read speed, and excellent scalability. However, poor endurance and high write energy appear to be the challenges to be tackled before PRAM can be adopted as main memory. In order to mitigate these limitations, prior research focuses on reducing write intensity at the bit level. In this work, we study the data pattern of memory write operations, and explore the frequent-value locality in data written back to main memory. Based on the fact that many data are written to memory repeatedly, an architecture of frequent-value storage is proposed for PRAM memory. It can significantly reduce the write intensity to PRAM memory so that the lifetime is improved and the write energy is reduced. The trade-off between endurance and capacity of PRAM memory is explored for different configurations. After using the frequent-value storage, the endurance of PRAM is improved to about 1.6X on average, and the write energy is reduced by 20%.\",\"PeriodicalId\":316253,\"journal\":{\"name\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"52\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.2011.5722186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2011.5722186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 52
摘要
相变随机存取存储器(Phase Change Random Access Memory, PRAM)具有高密度、非易失性、读取速度快、可扩展性好等优点,具有取代DRAM作主存的巨大潜力。然而,在PRAM被用作主存之前,较差的续航能力和较高的写入能量似乎是需要解决的挑战。为了减轻这些限制,先前的研究主要集中在降低比特级别的写入强度。在这项工作中,我们研究了内存写操作的数据模式,并探讨了写回主存的数据中的频率值局部性。针对大量数据被重复写入存储器的特点,提出了一种基于频率值存储的PRAM存储器结构。它可以显著降低对PRAM内存的写入强度,从而提高寿命,减少写入能量。探讨了不同配置下PRAM存储器的持久性能和容量之间的权衡。采用频率值存储后,PRAM的持久时间平均提高到1.6倍左右,写入能量降低20%。
Phase Change Random Access Memory (PRAM) has great potential as the replacement of DRAM as main memory, due to its advantages of high density, non-volatility, fast read speed, and excellent scalability. However, poor endurance and high write energy appear to be the challenges to be tackled before PRAM can be adopted as main memory. In order to mitigate these limitations, prior research focuses on reducing write intensity at the bit level. In this work, we study the data pattern of memory write operations, and explore the frequent-value locality in data written back to main memory. Based on the fact that many data are written to memory repeatedly, an architecture of frequent-value storage is proposed for PRAM memory. It can significantly reduce the write intensity to PRAM memory so that the lifetime is improved and the write energy is reduced. The trade-off between endurance and capacity of PRAM memory is explored for different configurations. After using the frequent-value storage, the endurance of PRAM is improved to about 1.6X on average, and the write energy is reduced by 20%.