窄带和宽带RFI噪声下LTE无线电共存风险研究

Jaejin Lee, Kae-An Liu, Hao-han Hsu, Chung-hao Chen, Dong-ho Han
{"title":"窄带和宽带RFI噪声下LTE无线电共存风险研究","authors":"Jaejin Lee, Kae-An Liu, Hao-han Hsu, Chung-hao Chen, Dong-ho Han","doi":"10.1109/USNC-URSI.2018.8602751","DOIUrl":null,"url":null,"abstract":"Impact of narrow and broadband RFI noise on LTE performance is quantitatively characterized. Both narrow and broadband RFI noise starts to decrease throughput at the level of −101 dBm/100kHz. However, broadband noise causes throughput degradation at higher rate of 1.7 Mbps/dB than 1.1 Mbps/dB of narrowband noise. This study provides understanding of RFI noise characteristics and quantitative RFI impact on LTE performance. It can also provide good insights for designers to design reliable mobile platform and radio communication.","PeriodicalId":203781,"journal":{"name":"2018 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Study of LTE Radio Coexistance Risk with Narrow and Broadband RFI Noise\",\"authors\":\"Jaejin Lee, Kae-An Liu, Hao-han Hsu, Chung-hao Chen, Dong-ho Han\",\"doi\":\"10.1109/USNC-URSI.2018.8602751\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Impact of narrow and broadband RFI noise on LTE performance is quantitatively characterized. Both narrow and broadband RFI noise starts to decrease throughput at the level of −101 dBm/100kHz. However, broadband noise causes throughput degradation at higher rate of 1.7 Mbps/dB than 1.1 Mbps/dB of narrowband noise. This study provides understanding of RFI noise characteristics and quantitative RFI impact on LTE performance. It can also provide good insights for designers to design reliable mobile platform and radio communication.\",\"PeriodicalId\":203781,\"journal\":{\"name\":\"2018 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/USNC-URSI.2018.8602751\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/USNC-URSI.2018.8602751","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

窄带和宽带RFI噪声对LTE性能的影响进行了定量表征。窄带和宽带RFI噪声在−101 dBm/100kHz时开始降低吞吐量。然而,宽带噪声导致吞吐量下降的速率为1.7 Mbps/dB,高于窄带噪声的1.1 Mbps/dB。本研究提供了RFI噪声特性和定量RFI对LTE性能的影响的理解。为设计人员设计可靠的移动平台和无线电通信提供了很好的参考。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Study of LTE Radio Coexistance Risk with Narrow and Broadband RFI Noise
Impact of narrow and broadband RFI noise on LTE performance is quantitatively characterized. Both narrow and broadband RFI noise starts to decrease throughput at the level of −101 dBm/100kHz. However, broadband noise causes throughput degradation at higher rate of 1.7 Mbps/dB than 1.1 Mbps/dB of narrowband noise. This study provides understanding of RFI noise characteristics and quantitative RFI impact on LTE performance. It can also provide good insights for designers to design reliable mobile platform and radio communication.
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